X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, N.Y, August 31-September 4, 1987. Vol. 56
- New York Springer Verlag 1987
- 454 p.
- Springer Series in Optical Sciences .
0-387-19392-8
MICROSCOPIA MICROMETRIA ILUMINACION MICROSCOPIA CON LUZ