X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, N.Y, August 31-September 4, 1987. Vol. 56
SAYRE, David
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, N.Y, August 31-September 4, 1987. Vol. 56 - New York Springer Verlag 1987 - 454 p. - Springer Series in Optical Sciences .
0-387-19392-8
MICROSCOPIA
MICROMETRIA
ILUMINACION
MICROSCOPIA CON LUZ
681.723 SAY. VOL 56
X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, N.Y, August 31-September 4, 1987. Vol. 56 - New York Springer Verlag 1987 - 454 p. - Springer Series in Optical Sciences .
0-387-19392-8
MICROSCOPIA
MICROMETRIA
ILUMINACION
MICROSCOPIA CON LUZ
681.723 SAY. VOL 56